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The Cambridge Solid State Science Series aims to provide accounts of the properties of solids both from a phenomenological and a theoretical viewpoint. A primary aim is to relate macroscopic physical or chemical properties to the atomic and electronic theory of solids wherever this is possible, or to the crystalline or other structure where this is more feasible. The books cut across the boundaries of physics, chemistry, engineering and materials science, and include titles on polymers, semiconductors, metals, ceramics and glasses.

  • General Editors: D. R. Clarke, University of California, Santa Barbara, S. Suresh, Massachusetts Institute of Technology, I. M. Ward, University of Leeds

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21 results in Cambridge Solid State Science Series

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Surface Analysis of Polymers by XPS and Static SIMS
  • D. Briggs
  • Published online:
    08 October 2009
    Print publication:
    02 April 1998
  • This book provides an in-depth treatment of the instrumentation, physical bases and applications of X-ray photoelectron spectroscopy (XPS) and static secondary ion mass spectroscopy (SSIMS) with a specific focus on the subject of polymeric materials. XPS and SSIMS are widely accepted as the two most powerful techniques for polymer surface chemical analysis, particularly in the context of industrial research and problem solving. In this book, the techniques of XPS and SSIMS are described and in each case the author explains what type of information may be obtained. The book also includes details of case studies emphasising the complementary and joint application of XPS and SSIMS in the investigation of polymer surface structure and its relationship to the properties of the material. This book will be of value to academic and industrial researchers interested in polymer surfaces and surface analysis.

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