Hostname: page-component-55f67697df-sqlfs Total loading time: 0 Render date: 2025-05-08T14:27:22.863Z Has data issue: false hasContentIssue false
  • English
  • Français

RECIPROCAL-LATTICE SPACE IMAGING OF X-RAY INTENSITIES DIFFRACTED FROM NANOWIRES

Published online by Cambridge University Press:  01 February 2011

Osami Sakata ,
Akiko Kitano ,
Wataru Yashiro ,
Kunihiro Sakamoto ,
Kazushi Miki ,
Akifumi Matsuda ,
Wakana Hara ,
Shusaku Akiba  and
Mamoru Yoshimoto
Osami Sakata
Affiliation:
Materials Science Division, Japan Synchrotron Radiation Research Institute (JASRI) / SPring-8, 1–1–1 Kouto, Mikazuki, Sayo, Hyogo 679–5198, Japan
Akiko Kitano
Affiliation:
Materials Science Division, Japan Synchrotron Radiation Research Institute (JASRI) / SPring-8, 1–1–1 Kouto, Mikazuki, Sayo, Hyogo 679–5198, Japan
Wataru Yashiro
Affiliation:
Nanomaterials Laboratory, National Institute for Materials Science (NIMS), 1–1 Namiki, Tsukuba Sengen, Ibaraki, 305–8568, Japan
Kunihiro Sakamoto
Affiliation:
Nanoelectronics Research Institute (NeRI), National Institute of Advanced Industrial Science and Technology (AIST), 1–1–1 Umezono, Tsukuba, Ibaraki, 305–8568, Japan
Kazushi Miki
Affiliation:
Nanomaterials Laboratory, National Institute for Materials Science (NIMS), 1–1 Namiki, Tsukuba Sengen, Ibaraki, 305–8568, Japan
Akifumi Matsuda
Affiliation:
Materials & Structures Laboratory, Tokyo Institute of Technology, 4259 Nagatsuta, Midori-ku, Yokohama, 226–8503, Japan
Wakana Hara
Affiliation:
Materials & Structures Laboratory, Tokyo Institute of Technology, 4259 Nagatsuta, Midori-ku, Yokohama, 226–8503, Japan
Shusaku Akiba
Affiliation:
Materials & Structures Laboratory, Tokyo Institute of Technology, 4259 Nagatsuta, Midori-ku, Yokohama, 226–8503, Japan
Mamoru Yoshimoto
Affiliation:
Materials & Structures Laboratory, Tokyo Institute of Technology, 4259 Nagatsuta, Midori-ku, Yokohama, 226–8503, Japan
Get access

Abstract

A nondestructive method has been developed for quickly characterizing a 1 D crystalline structure. It required brilliant synchrotron x-rays in grazing incidence and an x-ray 2 D detector. X-ray patterns recorded on the detector showed anisotropically sheet-shape diffraction from NiO nanowires epitaxially grown on an ultra-smooth sapphire (0 0 0 1). Other shots obtained from Bi atomic wires embedded in Si (0 0 1) showed that the wires have a 2 × n superstructure, which indicated that the Bi-dimer bonds were parallel to the wires.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 840: Symposium Q – Neutron and X-Ray Scattering as Probes of Multiscale Phenomena , 2004 , Q6.4
Copyright
Copyright © Materials Research Society 2005

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

Article purchase

Temporarily unavailable

References

REFERENCES

1. Sakata, O., Takata, M., Suematsu, H., Matsuda, A., Akiba, S., Sasaki, A., and Yoshimoto, M., Appl. Phys. Lett. 84, 4239 (2004).Google Scholar
2. Yoshimoto, M., Maeda, T., Ohnishi, T., Koinuma, H., Ishiyama, O., Shinohara, M., Kubo, M., Miura, R. and Miyamoto, A., Appl. Phys. Lett. 67, 2615 (1995).Google Scholar
3. Takakura, M., Miyahara, T., Tashiro, J., Sasaki, A., Furusawa, M., and Yoshimoto, M., Mater. Res. Soc. Proc. 648, p6.5.1 (2001).Google Scholar
4. Chadi, D. J., Phys. Rev. Lett. 59, 1691 (1987).Google Scholar
5. Sakamoto, K., Sakamoto, T., Miki, K., and Nagao, S., J. Electrochem. Soc. 136, 2705 (1989).Google Scholar
6. Miki, K., Owen, J. H. G., Bowler, D. R., Briggs, G. A. D., and Sakamoto, K., Surf. Sci. 421, 397 (1999).;Google Scholar
Miki, K., Bowler, D.R., Owen, J.H.G., Briggs, G.A.D., and Sakamoto, K.. Phys. Rev. B59 14868 (1999).Google Scholar
7. Sakata, O., Furukawa, Y, Goto, S., Mochizuki, T., Uruga, T., Takeshita, K., Ohashi, H., Ohata, T., Matsushita, T., Takahashi, S., Tajiri, H., Ishikawa, T., Nakamura, M., Ito, M., Sumitani, K., Takahashi, T., Shimura, T., Saito, A., and Takahasi, M., Surface Review and Letters, 10, 543 (2003).Google Scholar
8. Owen, J. H. G., Miki, K., Koh, H., Yeom, H. W., and Bowler, D. R., Phys. Rev. Lett., 88, 226104–1(2002).Google Scholar