Hostname: page-component-669899f699-2mbcq Total loading time: 0 Render date: 2025-05-03T14:15:49.162Z Has data issue: false hasContentIssue false
  • English
  • Français

Improved Resolution in A P-I-N Image Sensor by Changing the Structure of the Doped Layers

Published online by Cambridge University Press:  17 March 2011

M. Vieira ,
M. Fernandes ,
J. Martins ,
P. Louro ,
A. Maçarico ,
R. Schwarz  and
M. Schubert
M. Vieira
Affiliation:
Electronics and Communications Dept., ISEL, R. Conselheiro Emídio Navarro, P 1949-014 Lisboa, Portugal. Email:[email protected]
M. Fernandes
Affiliation:
Electronics and Communications Dept., ISEL, R. Conselheiro Emídio Navarro, P 1949-014 Lisboa, Portugal. Email:[email protected]
J. Martins
Affiliation:
Electronics and Communications Dept., ISEL, R. Conselheiro Emídio Navarro, P 1949-014 Lisboa, Portugal. Email:[email protected]
P. Louro
Affiliation:
Electronics and Communications Dept., ISEL, R. Conselheiro Emídio Navarro, P 1949-014 Lisboa, Portugal. Email:[email protected]
A. Maçarico
Affiliation:
Electronics and Communications Dept., ISEL, R. Conselheiro Emídio Navarro, P 1949-014 Lisboa, Portugal. Email:[email protected]
R. Schwarz
Affiliation:
Electronics and Communications Dept., ISEL, R. Conselheiro Emídio Navarro, P 1949-014 Lisboa, Portugal. Email:[email protected]
M. Schubert
Affiliation:
Institut fur Physikalische Elektronik, Universitat Stuttgart, Pfaffenwaldring 47, D-70569 Stuttgart, Germany
Get access

Abstract

An amorphous ZnO/p-i-n/Al imager that uses a small-signal scanning beam to read out the short circuit current signal is presented. An analysis of the image geometric distortion, restoration, and enhancement is performed. A simple image-processing algorithm is used to recover main features of projected images. Modifications of the transducer structure are proposed for improving the sensor performance.The effect of the doped layers and image intensity on the sensor output characteristics are analysed. Results show that a trade-off between the sensor structure and contact geometry is needed for a correct read-out. Algorithms and tools are proposed for image analysis.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 609: Symposium A – Amorphous & Heterogeneous Silicon Thin Films – 2000 , 2000 , A14.2
Copyright
Copyright © Materials Research Society 2000

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

Article purchase

Temporarily unavailable

References

REFERENCES

[1] Torkel, J., Wallmark, Proc. IRE 43 (1956) 474.Google Scholar
[2] Chen, I., J. Appl. Phys. 64 (1988) 2224.Google Scholar
[3] Fortunato, E., Vieira, M., Lavareda, G., Ferreira, L., and Martins, R., J. of Non-Crystalline Solids 164–166 (1993) 797.Google Scholar
[4] Vieira, M., Appl. Phys. Lett. 70 (1997) 220.Google Scholar
[5] Vieira, M., Fantoni, A., Koynov, S., and Schwarz, R., Thin Solid Films 296 (1997) 164.Google Scholar
[6] Vieira, M., Maçarico, A., Morgado, E., and Schwarz, R., J. of Non-Crystalline Solids 227 (1998) 1311.Google Scholar
[7] Chakrabarti, S., Siegmund, O. H. W., Hecht, J., Proc. SPIE 834 (1987) 222.Google Scholar
[8] Henke, L. B., Liesegang, J., Smith, S. D., Phys. Rev. 19 (1979) 3004.Google Scholar
[9] Sousa, F., Martins, J., Fernandes, M., A. Maçarico, Schwarz, R., and Vieira, M.,, J. of Non-Crystalline Solids (2000).Google Scholar
[10] Koch, C., Ito, M., Schubert, M., and Werner, J. H., Mat. Res. Soc. Symp. Proc. 557 (1999) 749.Google Scholar
[11] Martins, J., Sousa, F., Fernandes, M., A. Maçarico, Louro, P., and Vieira, M., European Mat. Material Science and Engineering B69–70 (2000) 494.Google Scholar
[12] D. Noorlag, J. W., PhD thesis, Delft University of Technology (1982).Google Scholar