Published online by Cambridge University Press: 28 February 2011
A GaAs/AlxGal−xAs multiple quantum well structure was examined using low temperature (35K) cathodoluminescence in a transmission electron microscope. In this sample, stacking faults were found to occur in two different forms. The intensity of the dominant n=l(e-hh) luminescence was observed to decrease in the immediate vicinity of either form. In addition, stacking faults gave rise to several new emission features on the low energy side of the main peak. We discuss differences in cathodoluminescence spectra obtained from the two stacking fault configurations and present evidence to suggest that these features may be due to extrinsic luminescence from impurities associated with the stacking faults.