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Enhancing Superconducting Parameters by Array of External Magnetic Dots

Published online by Cambridge University Press:  31 January 2011

Wei Jiang Yeh  and
Bo Cheng
Wei Jiang Yeh
Affiliation:
[email protected], University of Idaho, Physics Department, P.O. Box 440903, Moscow, Idaho, 83844-0903, United States, (208)885-6380, (208)885-4055
Bo Cheng
Affiliation:
[email protected], University of Idaho, Department of Physics, Moscow, Idaho, United States
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Abstract

Enhancing the pinning force in high-Tc superconductors can be achieved by externally introduced periodic magnetic dots. We use a novel nano-technique to deposit periodic sub-micon Ni dots on YBa2Cu3O7 thin films. The current versus voltage characteristics of an YBa2Cu3O7 thin film strip with uniform Ni dots are measured at various temperatures and magnetic fields. They are compared with the current versus voltage characteristics of a bare YBa2Cu3O7 thin film strip without magnetic dots. It is found the critical current value of the strip with Ni dots reduces with a much slower pace as the magnetic field strength increases in comparison with the value of the bare sample.

Keywords

superconductingnanoscalemagnetic
Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 1180: Symposium CC – Nanoscale Functionalization and New Discoveries in Modern Superconductivity , 2009 , 1180-CC05-09
Copyright
Copyright © Materials Research Society 2009

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References

1 Sauerzopf, F. M. Wiesinger, H. P. Weber, H. W. Crabtree, G. W. and Liu, J. Z. Physica C, 162-164, 751 (1989).Google Scholar
2 Civale, L. Marwick, A. D. Worthington, T. K. Kirk, M. A. Thompson, J. R. Krusinelbaum, L. Sun, Y. Clem, J. R. and Holtzberg, F. Phys. Rev. Lett. 67, 648 (1991).Google Scholar
3 Kato, T. Shibauchi, T. Matsuda, Y. Thompson, J. R. Krusin-Elbaum, L., Physica C, 463-465, 240 (2007).Google Scholar
4 Baert, M. Metlushko, V. V. Jonckheere, R. Moshchalkov, V. V. and Bruynseraede, Y. Phys. Rev. Lett. 74, 3269 (1995).Google Scholar
5 Rosseel, E. Puig, T., Baert, M. Bael, M.J. Van, Moshchalkov, V.V. and Bruynseraede, Y., Physica C, 282, 1567 (1997).Google Scholar
6 Silhanek, A. V. Look, L. Van, Jonckheere, R. Zhu, B. Y. Raedts, S. and Moshchalkov, V. V. Phys. Rev. B, 72, 014507 (2005).Google Scholar
7 Prischepa, S. L. Armenio, A. A. Maritato, L. Kushnir, V. N. and Barbanera, S. Supercond. Sci. Technol. 18, 152 (2005).Google Scholar
8 Martin, J. I. Velez, M. Nogues, J. and Schuller, Ivan K. Phys. Rev. Lett. 79, 1929(1997) and Phys. Rev. Lett. 85, 1022 (1999).Google Scholar
9 Morgan, D. J. and Ketterson, J. B. Phys. Rev. Lett. 80, 3614 (1997).Google Scholar
10 Lange, M. Van Bael, M. J., Bruynseraede, Y. and Moshchalkov, V. V. Phys. Rev. Lett. 90, 197006–1 (2003).Google Scholar
11 Eisenmenger, J. Oettinger, M. Pfahler, C. Plettl, A. Walther, P. and Ziemann, P. Phys. Rev. B, 75, 144514 (2007).Google Scholar
12 Tonucci, R. J. Justus, B. L. Campillo, A. J. and Ford, C. E, Science 258, 783 (1992).Google Scholar
13 Pearson, D. H. and Tonucci, R. J. Science 270, 68 (1995).Google Scholar
14 Zhang, Y.Z. and Yeh, W. J.. IEEE Trans. Appl. Supercond. 5, 1517 (1995).Google Scholar
15 Bezryadin, A. and Pannetier, B. J. Low Temp. Phys. 102, 73 (1996).Google Scholar